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  • × 2nd International Telecommunication Conference "Advanced Micro- and Nanoelectronic Systems and Technologies
  • × Defects formation
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1 Effect of the active mode NMOS-transistor irradiated on formation of surface defects [会议论文]

作者:Petukhov, K.A.^1, Popov, V.D.^1

关键词:Active mode;Defects formation;...

会议举办机构:National Research Nuclear University MEPhI, Moscow Engineering Physics Institute, Kashirskoe shosse 31, Moscow

会议时间:2019

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